A View of the New Space Sector Resilience
Sirin Orbital Systems AG is glad to participate in ESREL 2020 – PSAM15 and to share its view on New Space Sector Resilience! The ESREL 2020 – PSAM15 is the most important conference in the areas of risk, resilience and reliability, taking place only every eight years.
Historically, the public awareness of space hazards was limited to the countries, who had operational scientific space missions. The growing volume and variety of data and signals affect the reliable operation of down-stream (ground-based) systems. Though the old space era can be considered as a resilient era the through analysis shows that this assumption is not correct since it does not fulfil all the criteria of a resilient system such as self-reliance, overlap, diversity and ability to learn. The New Space sector’s rapid development challenges the concept of resilience for this sector. Risk assessment methods for ground-based or terrestrial systems were traditionally based on vulnerability identification for a specific component to an adverse event followed by its functionality loss. The subsequent risk management was focused on hardening specific components to an acceptable risk level in order to prevent the overall system failure. Though higher risk levels were accepted in the old era’s space sector, methodology for risk assessment remained the same. The space paradigm shift results in an increasing number of uncertainties and the New Space sector’s interdependency. This fosters research on new risk assessment methodologies. A large number of risk reports are dedicated to resilience properties in the electricity, nuclear, transportation and other sectors, and the space sector is out of focus. This article aims at presenting a New Space resilience framework, describing methodologies for its assessment and adapting quantitative indices. It is especially important in light of new innovation ecosystems development using New Space capabilities.
Read more on: https://www.rpsonline.com.sg/proceedings/esrel2020/html/4578.xml
Published by Research Publishing, Singapore.
ISBN/DOI: 978-981-14-8593-0